PHOTOBLIND
SENSORS

DIRECT
DETECTION
CAMERA

Direct Electron DE-16 Camera

A New Sensor FOr Experiments Involving Light

Direct Electron’s Photoblind sensor upgrades are available for the DE-16, DE-64, and Celeritas XS cameras. The Photoblind sensors are designed to enable experiments in microscope columns that contain bright light (or ultra-violet, or infra-red) sources. This includes laser-driven ultrafast or dynamic transmission electron microscopy, and electron microscopes designed to expose specimens to high intensity illumination for in situ TEM experiments.

In these environments, photons from the light source that reach the camera excite a signal, creating background noise in recorded images, which can degrade experimental results.

Our photoblind sensor features a proprietary coating that blocks all photons from reaching the sensor, whilst allowing electrons with over 100 keV of energy to pass through. This allows laser-driven or in situ illumination TEM experiments to be performed without background photon noise.  

Direct Electron’s photoblind sensors are available either alongside the purchase of a camera, or as an upgrade for previously purchased cameras.

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WITH GUIDANCE FROM OUR TEAM OF PH.D MICROSCOPISTS

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