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The photoblind sensor upgrade for the DE-16 camera is designed to enable experiments in microscope columns that contain bright light sources. This includes laser-driven ultrafast or dynamic transmission electron microscopy, and electron microscopes designed to expose specimens to high intensity illumination for in situ TEM experiments.
In these environments, photons from the light source that reach the camera excite a signal, creating background noise, which can degrade experimental results.
Our photoblind sensor features a proprietary coating that blocks all photons from reaching the sensor, whilst allowing electrons with over 100 keV of energy to pass through. This allows laser-driven or in situ illumination TEM experiments to be performed without background photon noise.
The DE-16 offers industry-leading resolution and versatility that no other camera can match, and can be used for numerous applications on the same instrument. This includes in situ TEM, 4D STEM, Cryo-EM, micro electron diffraction, holography, ultrafast TEM, and EELS. Along with an integrated Faraday plate, users can access full-frame streaming at up to 92 frames per second or select smaller areas to readout at substantially faster frame rates (128 x 128 @ 4,237 fps).