EBSD WITH DIRECT ELECTRON’S DE-SEMCAM

In a preprint recently posted on arXiv, researchers from the University of California at Santa Barbara have reported using a new monolithic active pixel sensor (MAPS) based direct detector designed by Direct Electron for collecting electron backscatter diffraction (EBSD) data. As has previously been demonstrated in Transmission Electron Microscopy (TEM), by eliminating the need for a scintillator and fiber-optic coupling, direct detectors can achieve a higher detective quantum efficiency and a higher signal to noise ratio than conventional detectors. This is advantageous for EBSD as well as TEM imaging.

The new MAPS based detector is optimized for voltages typically used in SEM and EBSD. With 2048 x 2048 pixels, the detector offers high resolution EBSD pattern acquisition at a rate of 281 patterns per second. Pattern acquisition speed can be increased by reading out fewer rows of the detector. These rows need not be contiguous, allowing full EBSD patterns to be sub-sampled. Acquisition speeds of almost 6000 patterns per second have been demonstrated.

The preprint can be found at this link: https://arxiv.org/abs/2008.11411

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DE’s Carter Francis will be in Seattle at MRS April 8

Direct Electron Application Scientist Carter Francis will be presenting a poster entitled Opportunities and Challenges of In Situ 4D STEM for Dynamic Structural Analysisat the Materials Research Society Spring Meeting & Exhibit on the afternoon of Tuesday, April 8th from 5-7 PM on Level 2, Flex Hall C. If you’re attending MRS next week, April 7-11 at the Seattle Convention Center’s new Summit addition, don’t miss it. We hope to see you there!

Direct Electron will be at MSI in Dublin January 14-16

Our European Sales Manager, Eddie Regan will be at the Microscopy Society of Ireland Annual Symposium 2025 this month at University College Dublin. The conference will run from Tuesday, January 14th through Thursday, January 16th at the O’Brien Centre for Science. We hope to see you there!

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