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15keV comparison between the LV-16 (left) and a non-direct detection camera (right). The images show a silicon surface,
collected in PEEM mode. The integration time was 300 seconds. The circle marks the same area in both images.
The LV-16 was operated with 2x binning so that both images are 2k x 2k pixels.
Courtesy of Rudolf Tromp, (IBM, Yorktown Heights, NY, USA).
The LV-16 is the first and only commercially-available direct detection camera for low voltage electron microscopy. It features the 10th generation of our revolutionary Direct Detection Device (DDD®) sensor. In addition to dramatically better resolution and a larger field-of-view, the LV-16 also allows delivers full-frame unbinned streaming at up to 92 frames per second (fps) for motion correction or analysis of dynamics. For higher speeds, users acquire data at 281 fps with full-frame readout and 2×-binning, and substantially faster frame rates can be achieved by reducing the readout array size.
All of our LV-series cameras deliver state-of-the-art performance and unique features that make them ideal for a wide range of low voltage electron microscopy applications, including LEEM/PEEM. The LV-16 allows for direct detection of 10 – 40 keV primary electrons—a revolutionary advancement in data quality. Its improved resolution yields approximately 8× more information per image compared to MCP+CCD. Direct Electron’s patented “movie mode” provides high-speed acquisition of a continuous stream of frames with nearly 100% duty cycle and little to no dead time between frames. Specifically designed for low voltage applications to give you clear data at incredibly quick speeds.
Left: image of Si(111), with (7×7) (bright) and (1×1) (dark) co-existing at about 860 Celsius, imaged in LEEM mode at 10.7 eV.
The dark spot is a carbide defect on the surface and the lines emanating from it are atomic steps.
Right: A LEED diffraction pattern of Si(111) acquired at 5.5 keV bounded by the edge of the Ewald sphere.
Diffraction spots are due to the (7×7) reconstruction.
Courtesy of Rudolf Tromp, IBM.
Our DE-SEMCam is based on our LV-16 detector and is designed to be mounted into an SEM.
Our first DE-SEMCam was installed for Prof. Gianola at the University of California at Santa Barbara. See some of their initial results in Ultramicroscopy.
If you have questions about our products, head to our FAQ page, or contact us to learn more.