Bob Monteverde to Attend Mountain States Society of Electron Microscopists Meeting

Director of Sales, Bob Monteverde, will be attending the Mountain States Society of Electron Microscopists (MSSEM) meeting this Thursday at Colorado University, Boulder.

The annual MSSEM meeting brings together researchers, students, and industry experts from across the region to discuss the latest advances in electron microscopy and related technologies. The event features scientific talks, poster presentations, and vendor exhibits, creating valuable opportunities to connect with the microscopy community.

If you’re attending MSSEM, be sure to say hello to Bob and learn more about how our technology is helping researchers push the boundaries of TEM imaging and analysis.

What’s New

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Featuring Dr. Julia Pürstl from Forschungszentrum Jülich, this session will explore sample preparation considerations, experimental setup optimization, in-situ strain holder demonstration, data processing & more.

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain,

5 KEY DIFFERENCES BETWEEN HYBRID AND MAPS DIRECT DETECTORS FOR 4D-STEM

Your detector doesn’t just collect data—
it defines its limits.

Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese

Dr. Barnaby Levin to Present at MSC-SMC 2026 in Montreal

Direct Electron is pleased to announce that Dr. Barnaby Levin will be presenting at the 52nd

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.