Direct Electron presenting a talk at Illinois Advanced Electron Microscopy Workshop

Our materials applications scientist, Dr Barnaby Levin, will be presenting a talk at the University of Illinois Urbana-Champaign workshop on Advanced Electron Microscopy in on June 8th. The talk is titled “Optimizing a monolithic active pixel sensor detector for 4D STEM”, and will provide an overview of direct detector technology, and explain some of the innovations used to optimize our Celeritas and Celeritas XS detectors for 4D STEM. In addition, Dr Levin’s talk will cover novel scanning techniques, and other potential applications of the Celeritas direct detectors.

What’s New

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Featuring Dr. Julia Pürstl from Forschungszentrum Jülich, this session will explore sample preparation considerations, experimental setup optimization, in-situ strain holder demonstration, data processing & more.

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain,

5 KEY DIFFERENCES BETWEEN HYBRID AND MAPS DIRECT DETECTORS FOR 4D-STEM

Your detector doesn’t just collect data—
it defines its limits.

Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese

Dr. Barnaby Levin to Present at MSC-SMC 2026 in Montreal

Direct Electron is pleased to announce that Dr. Barnaby Levin will be presenting at the 52nd

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.