Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese Society of Microscopy. The conference will take place on May 25-27 in Sendai International Center, Aoba-ku, Sendai City, Miyagi.
We’ll be at the Tega Science booth and looking forward to discussing our direct detectors, such as our Celeritas, Apollo, and DE-Series detectors, with attendees at the meeting. Please contact us if you’d like to schedule some time to talk with us at the event.
Direct Electron Heads to Tokyo for LEEM/PEEM-14 Direct Electron is heading to Tokyo for the
Our Director of Sales, Bob Monteverde, will be attending the 2026 Annual Fall Meeting of
Abstract submissions are now open for the 2027 MRS Spring Meeting & Exhibit, including Symposium
Apollo collected nine MicroED datasets in under 30 minutes at 8× the rotation rate of CETA-D—with lower R factors at room temperature, too!
Catch up with Direct Electron at IMC21 Direct Electron Applications Scientist Dr. Barnaby Levin will
Direct Electron Heads to Tokyo for LEEM/PEEM-14 Direct Electron is heading to Tokyo for the 14th International Conference on LEEM/PEEM (LEEM/PEEM-14), taking place October 5–9, 2026, at the University of Tokyo’s Hongo Campus. Bob Monteverde, Director of Sales at Direct Electron, will be attending alongside Shinya Kondo of our Japanese partner, TEGA Science. If you’ll be at LEEM/PEEM-14, we hope you’ll take the opportunity to connect with Bob and Shinya and learn more about the latest developments in direct detection for low-energy electron microscopy. Bringing Direct Detection to LEEM and PEEM LEEM/PEEM-14 brings together researchers, instrument developers, and industry partners working in Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM). This year’s program spans surface and thin-film science, advanced microscopy techniques, interdisciplinary applications, tutorials, invited lectures, and poster sessions. These applications are particularly important to Direct Electron. The LV-16 Direct Detection Camera was developed specifically to bring the advantages of direct electron detection to low-energy electron microscopy, including LEEM and PEEM. With a 4k × 4k field of view, high sensitivity and resolution, and high-speed continuous acquisition, the LV-16 is designed for demanding low-energy microscopy applications. Its direct detection architecture eliminates the intermediate conversion and coupling stages found in traditional detector systems, helping preserve image quality and detector performance. Meet Us in Tokyo LEEM/PEEM-14 continues a conference tradition dating to 1998 and returns to Japan for the first time since the 2006 meeting in Himeji. This year’s conference will be held at Ito Hall on the University of Tokyo’s Hongo Campus in Tokyo. If you’re attending, look for Bob Monteverde and Shinya Kondo during the conference. They would be happy to discuss your LEEM/PEEM research, detector requirements, and how direct detection could benefit your low-energy electron microscopy applications. We look forward to seeing the LEEM/PEEM community in Tokyo! LEEM/PEEM-14October 5–9, 2026University of Tokyo, Hongo CampusTokyo, Japan
Our Director of Sales, Bob Monteverde, will be attending the 2026 Annual Fall Meeting of the Appalachian Regional Electron Microscopy Society (AReMS), October 1–2, 2026, at Morven Farms and the University of Virginia in Charlottesville, Virginia. AReMS brings together scientists, engineers, educators, students, and microscopy professionals from across the region to exchange knowledge and explore advances in microscopy and microanalysis. We look forward to connecting with colleagues and attendees throughout this year’s program. If you’ll be at AReMS, be sure to find Bob and say hello! Learn more about the 2026 AReMS Annual Fall Meeting
