Dr. Barnaby Levin Attending TEM Gordon Research Conference

We’re pleased to share that our Applications Scientist, Dr. Barnaby Levin, is attending the upcoming Transmission Electron Microscopy for Materials Research Gordon Research Conference, one of the premier international meetings focused on advancing the frontiers of TEM science and instrumentation, to give a talk about cutting-edge MAPS Detector Technology.

The conference, running February 15-20, brings together leading researchers from around the world to present cutting-edge, often unpublished work while fostering deep scientific discussion and collaboration. This year’s program highlights recent breakthroughs in high-resolution TEM imaging and spectroscopy, while addressing key challenges such as imaging radiation-sensitive materials, improving throughput, and resolving structures in thicker samples.

As TEM technology continues to push toward theoretical limits, meetings like this help shape the next decade of innovation in materials characterization. We’re excited to see Barnaby engaging with the global TEM community and contributing to discussions driving the field forward.

And don’t forget to follow him on BlueSky at @bdalev.bsky.social!

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Direct Electron Heads to Tokyo for LEEM/PEEM-14

Direct Electron Heads to Tokyo for LEEM/PEEM-14 Direct Electron is heading to Tokyo for the 14th International Conference on LEEM/PEEM (LEEM/PEEM-14), taking place October 5–9, 2026, at the University of Tokyo’s Hongo Campus. Bob Monteverde, Director of Sales at Direct Electron, will be attending alongside Shinya Kondo of our Japanese partner, TEGA Science. If you’ll be at LEEM/PEEM-14, we hope you’ll take the opportunity to connect with Bob and Shinya and learn more about the latest developments in direct detection for low-energy electron microscopy. Bringing Direct Detection to LEEM and PEEM LEEM/PEEM-14 brings together researchers, instrument developers, and industry partners working in Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM). This year’s program spans surface and thin-film science, advanced microscopy techniques, interdisciplinary applications, tutorials, invited lectures, and poster sessions. These applications are particularly important to Direct Electron. The LV-16 Direct Detection Camera was developed specifically to bring the advantages of direct electron detection to low-energy electron microscopy, including LEEM and PEEM. With a 4k × 4k field of view, high sensitivity and resolution, and high-speed continuous acquisition, the LV-16 is designed for demanding low-energy microscopy applications. Its direct detection architecture eliminates the intermediate conversion and coupling stages found in traditional detector systems, helping preserve image quality and detector performance. Meet Us in Tokyo LEEM/PEEM-14 continues a conference tradition dating to 1998 and returns to Japan for the first time since the 2006 meeting in Himeji. This year’s conference will be held at Ito Hall on the University of Tokyo’s Hongo Campus in Tokyo. If you’re attending, look for Bob Monteverde and Shinya Kondo during the conference. They would be happy to discuss your LEEM/PEEM research, detector requirements, and how direct detection could benefit your low-energy electron microscopy applications. We look forward to seeing the LEEM/PEEM community in Tokyo! LEEM/PEEM-14October 5–9, 2026University of Tokyo, Hongo CampusTokyo, Japan

Direct Electron at the 2026 AReMS Annual Fall Meeting

Our Director of Sales, Bob Monteverde, will be attending the 2026 Annual Fall Meeting of the Appalachian Regional Electron Microscopy Society (AReMS), October 1–2, 2026, at Morven Farms and the University of Virginia in Charlottesville, Virginia. AReMS brings together scientists, engineers, educators, students, and microscopy professionals from across the region to exchange knowledge and explore advances in microscopy and microanalysis. We look forward to connecting with colleagues and attendees throughout this year’s program. If you’ll be at AReMS, be sure to find Bob and say hello! Learn more about the 2026 AReMS Annual Fall Meeting

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