EBSD WITH DIRECT ELECTRON’S DE-SEMCAM

In a preprint recently posted on arXiv, researchers from the University of California at Santa Barbara have reported using a new monolithic active pixel sensor (MAPS) based direct detector designed by Direct Electron for collecting electron backscatter diffraction (EBSD) data. As has previously been demonstrated in Transmission Electron Microscopy (TEM), by eliminating the need for a scintillator and fiber-optic coupling, direct detectors can achieve a higher detective quantum efficiency and a higher signal to noise ratio than conventional detectors. This is advantageous for EBSD as well as TEM imaging.

The new MAPS based detector is optimized for voltages typically used in SEM and EBSD. With 2048 x 2048 pixels, the detector offers high resolution EBSD pattern acquisition at a rate of 281 patterns per second. Pattern acquisition speed can be increased by reading out fewer rows of the detector. These rows need not be contiguous, allowing full EBSD patterns to be sub-sampled. Acquisition speeds of almost 6000 patterns per second have been demonstrated.

The preprint can be found at this link: https://arxiv.org/abs/2008.11411

What’s New

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Featuring Dr. Julia Pürstl from Forschungszentrum Jülich, this session will explore sample preparation considerations, experimental setup optimization, in-situ strain holder demonstration, data processing & more.

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain,

5 KEY DIFFERENCES BETWEEN HYBRID AND MAPS DIRECT DETECTORS FOR 4D-STEM

Your detector doesn’t just collect data—
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Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese

Dr. Barnaby Levin to Present at MSC-SMC 2026 in Montreal

Direct Electron is pleased to announce that Dr. Barnaby Levin will be presenting at the 52nd

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.