Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19

Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain.

His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging.

The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.

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Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.

Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese Society of Microscopy. The conference will take place on May 25-27 in Sendai International Center, Aoba-ku, Sendai City, Miyagi. We’ll be at the Tega Science booth and looking forward to discussing our direct detectors, such as our Celeritas, Apollo, and DE-Series detectors, with attendees at the meeting. Please contact us if you’d like to schedule some time to talk with us at the event.