First publication from the Celeritas XS detector

Prof. Paul Voyles and researchers at the University of Wisconsin Madison in the USA have published the first results acquired using a Celeritas XS detector in Ultramicroscopy.

They took advantage of the detector’s rapid acquisition speed and sensitivity to use 4D STEM to map large areas of metallic glasses at nanometer-scale spatial resolution based on local rotational symmetry in diffraction patterns.

The paper can be found at the link below:

https://doi.org/10.1016/j.ultramic.2022.113612

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DE’s Carter Francis will be in Seattle at MRS April 8

Direct Electron Application Scientist Carter Francis will be presenting a poster entitled Opportunities and Challenges of In Situ 4D STEM for Dynamic Structural Analysisat the Materials Research Society Spring Meeting & Exhibit on the afternoon of Tuesday, April 8th from 5-7 PM on Level 2, Flex Hall C. If you’re attending MRS next week, April 7-11 at the Seattle Convention Center’s new Summit addition, don’t miss it. We hope to see you there!

Direct Electron will be at MSI in Dublin January 14-16

Our European Sales Manager, Eddie Regan will be at the Microscopy Society of Ireland Annual Symposium 2025 this month at University College Dublin. The conference will run from Tuesday, January 14th through Thursday, January 16th at the O’Brien Centre for Science. We hope to see you there!

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