DE CAMERA USED IN STRUCTURAL BIOLOGY PAPER OF THE YEAR

Congratulations to Axel Brilot and colleagues on being awarded the Journal of Structural Biology Paper of the Year.

One of the principle investigators of the paper, Nikolaus Grigorieff, summarized it as follows: “Beam-induced motion, first described by Henderson and Glaeser in 1985, is a well-known problem that has plagued users of electron cryo-microscopy (cryo-EM) for decades. The motion occurs while the electron beam irradiates the sample and leads to significant blurring of the image and, ultimately, to loss of resolution in three-dimensional reconstructions of the visualized molecules.” In order to study beam-induced motion, Brilot and colleagues used the first commercially-available direct detector for TEM: a Direct Electron DE-12 Camera System. Dr. Grigorieff continued: “In addition to the higher sensitivity (DQE) compared to older detectors, the CMOS technology underlying the DE-12 camera is also able to record movies at a rate of 40 frames/second, ideal for the study of motion under the beam. Jointly with the Carragher/Potter lab, Axel and Anchi Cheng continued the study of beam-induced motion of DLPs using the DE-12 camera. They were the first to demonstrate that image blurring produced by beaminduced motion on ice-embedded specimens can be significantly reduced by aligning movie frames. This post-processing of electron micrographs thus overcomes one of the major obstacles limiting the resolution of cryo-EM structures. Movies have since transformed the field of cryo-EM and are now in common use.”

Dr. Briolot said that collaboration with Direct Electron critical during this study: “What I found most amazing about working with Direct Electron was how responsive they were in working with Anchi Cheng and I to implement movie mode acquisition and enable us to visualize and correct beam-induced motion. I was amazed at the time, but am even more so now, realizing that DE and Anchi were able to implement ‘movie mode’ in what seemed like just hours, with almost no hiccups once we started working.”

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Direct Electron Heads to Tokyo for LEEM/PEEM-14

Direct Electron Heads to Tokyo for LEEM/PEEM-14 Direct Electron is heading to Tokyo for the 14th International Conference on LEEM/PEEM (LEEM/PEEM-14), taking place October 5–9, 2026, at the University of Tokyo’s Hongo Campus. Bob Monteverde, Director of Sales at Direct Electron, will be attending alongside Shinya Kondo of our Japanese partner, TEGA Science. If you’ll be at LEEM/PEEM-14, we hope you’ll take the opportunity to connect with Bob and Shinya and learn more about the latest developments in direct detection for low-energy electron microscopy. Bringing Direct Detection to LEEM and PEEM LEEM/PEEM-14 brings together researchers, instrument developers, and industry partners working in Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM). This year’s program spans surface and thin-film science, advanced microscopy techniques, interdisciplinary applications, tutorials, invited lectures, and poster sessions. These applications are particularly important to Direct Electron. The LV-16 Direct Detection Camera was developed specifically to bring the advantages of direct electron detection to low-energy electron microscopy, including LEEM and PEEM. With a 4k × 4k field of view, high sensitivity and resolution, and high-speed continuous acquisition, the LV-16 is designed for demanding low-energy microscopy applications. Its direct detection architecture eliminates the intermediate conversion and coupling stages found in traditional detector systems, helping preserve image quality and detector performance. Meet Us in Tokyo LEEM/PEEM-14 continues a conference tradition dating to 1998 and returns to Japan for the first time since the 2006 meeting in Himeji. This year’s conference will be held at Ito Hall on the University of Tokyo’s Hongo Campus in Tokyo. If you’re attending, look for Bob Monteverde and Shinya Kondo during the conference. They would be happy to discuss your LEEM/PEEM research, detector requirements, and how direct detection could benefit your low-energy electron microscopy applications. We look forward to seeing the LEEM/PEEM community in Tokyo! LEEM/PEEM-14October 5–9, 2026University of Tokyo, Hongo CampusTokyo, Japan

Direct Electron at the 2026 AReMS Annual Fall Meeting

Our Director of Sales, Bob Monteverde, will be attending the 2026 Annual Fall Meeting of the Appalachian Regional Electron Microscopy Society (AReMS), October 1–2, 2026, at Morven Farms and the University of Virginia in Charlottesville, Virginia. AReMS brings together scientists, engineers, educators, students, and microscopy professionals from across the region to exchange knowledge and explore advances in microscopy and microanalysis. We look forward to connecting with colleagues and attendees throughout this year’s program. If you’ll be at AReMS, be sure to find Bob and say hello! Learn more about the 2026 AReMS Annual Fall Meeting

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