Direct Electron will be a Bronze Sponsor at The 13th International Conference on LEEM PEEM in Montréal, Canada. The conference runs from August 19th through the 23rd. We hope you’ll stop by to learn more about our new Mission Control Software & the LV-16 Direct Detection Camera ideal for LEEM/PEEM applications.

Explore Electron Microscopy Data Analysis with Carter Francis and the GLMS Webinar Series
From HyperSpy fundamentals to advanced 4D-STEM analysis, explore a five-part educational webinar series featuring Direct Electron’s Dr. Carter Francis.





