OXFORD INSTRUMENTS PARTNERS WITH DIRECT ELECTRON IN EUROPE

Oxford Instruments plc, a leading provider of high technology products and services to industrial companies and scientific research communities, is pleased to announce that its NanoAnalysis division has recently partnered with US-based Direct Electron who produce next-generation direct detection cameras for Transmission Electron Microscopes (TEM). NanoAnalysis will act on behalf of Direct Electron as their European distributor. These cameras are used by researchers across both academia and industry working in life science and materials science to image samples down to the atomic level.

Direct Electron was founded in 2007 to develop and deliver ultra-high performance cameras for electron microscopy. These high resolution cameras utilise Direct Detection Device (DDD®) technology which was developed in-house in conjunction with the University of California San Diego (UCSD). The cameras offer the ultimate resolution, sensitivity, and the largest available field-of-view. This combined offering enables microscopists to optimise the performance of their existing TEMs and collect high quality data, faster.

Bob Monteverde, Director of Business Development and Marketing at Direct Electron, said of the partnership “We are excited to be working with Oxford Instruments who are recognised leaders in their field. We are certain that our partnership will help to grow our brand across Europe, Middle East and India.”

Dr. Ian Wilcock, Managing Director NanoAnalysis, commented “Our extensive and cutting-edge product portfolio for SEM, TEM, and FIB is used across a range of academic and industrial application areas. The addition of Direct Electron’s Direct Detection cameras will further enhance our available solutions for life science and material science.”

What’s New

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Featuring Dr. Julia Pürstl from Forschungszentrum Jülich, this session will explore sample preparation considerations, experimental setup optimization, in-situ strain holder demonstration, data processing & more.

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain,

5 KEY DIFFERENCES BETWEEN HYBRID AND MAPS DIRECT DETECTORS FOR 4D-STEM

Your detector doesn’t just collect data—
it defines its limits.

Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese

Dr. Barnaby Levin to Present at MSC-SMC 2026 in Montreal

Direct Electron is pleased to announce that Dr. Barnaby Levin will be presenting at the 52nd

WEBINAR 4D-STEM in SEM: in-situ testing of metal alloys using a MAPS direct detector

Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.