What is an event-based detector?

One of the most common questions we have to answer when we describe why our Apollo detector is so effective at electron counting is the question of what an event-based detector is.

Event-based detectors have a fascinating history, dating back to the late 1980s and early 1990s, and efforts to replicate the way that animals see the world with our eyes, optic nerves, and brains.

For certain applications, including electron counting, event-based detectors promise to be a far more data efficient and cost effective alternative to conventional frame-based detectors.

To properly explain the differences between event-based and frame-based detectors, some of our applications specialists recently took the opportunity to write an article for Microscopy and Analysis magazine.

You can find their article at the link below for a full answer to the question “What is an event-based detector”?

https://analyticalscience.wiley.com/do/10.1002/was.000700117

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Ben Bammes to Give Talk at Gordon Research Conference in Barcelona, Spain

The conference will be held at the Rey Don Jaime Grand Hotel in Castelldefels, Spain, June 14 – 19 Direct Electron is pleased to announce that Dr. Ben Bammes, Director of Research & Development, has been invited to speak at the Gordon Research Conference on Three Dimensional Electron Microscopy in Barcelona, Spain. His presentation, “Recent Advances and Future Opportunities in Direct Detection Technology,” will explore how advances in direct electron detection continue to expand the capabilities of electron microscopy, from cryo-EM to emerging techniques such as 4D-STEM and in situ imaging. The Gordon Research Conference is one of the premier international meetings in the field, bringing together leading researchers to discuss cutting-edge developments and future directions in 3D electron microscopy. We are honored to contribute to this year’s program and look forward to engaging with the global microscopy community.

Direct Electron at 82nd Annual JSM Meeting!

Director of Sales Bob Monteverde will be attending The 82nd Annual Meeting of The Japanese Society of Microscopy. The conference will take place on May 25-27 in Sendai International Center, Aoba-ku, Sendai City, Miyagi. We’ll be at the Tega Science booth and looking forward to discussing our direct detectors, such as our Celeritas, Apollo, and DE-Series detectors, with attendees at the meeting. Please contact us if you’d like to schedule some time to talk with us at the event.

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